Journal: Proceedings of the IEEE

Volume 74, Issue 12

1603 -- 1604Kenneth A. Pickar, James D. Meindl. Scanning the issue
1605 -- 1622Glenford J. Myers, Albert Y. C. Yu, David L. House. Microprocessor technology trends
1623 -- 1635Shojiro Asai. Semiconductor memory trends
1636 -- 1645Nobuo Okuda, Masamichi Sugai, Nobuyuki Goto. Semicustom and custom LSI technology
1646 -- 1668William C. Holton, Ralph K. Cavin III. A perspective on CMOS technology trends
1669 -- 1677Tak H. Ning, Denny D. Tang. Bipolar trends
1678 -- 1702Dale M. Brown, Mario Ghezzo, Joseph M. Pimbley. Trends in advanced process technology - Submicrometer CMOS device design and process requirements
1703 -- 1714Yochi Akasaka. Three-dimensional IC trends
1715 -- 1729Murray H. Woods. MOS VLSI reliability and yield trends
1730 -- 1740Robert W. Dutton, Mark R. Pinto. The use of computer aids in IC technology evolution
1753 -- 1774Andrrew J. Steckl. Particle-beam fabrication and in situ processing of integrated circuits
1775 -- 1793Randall A. Hughes, John D. Shott. The future of automation for high-volume Wafer fabrication and ASIC manufacturing
1799 -- 1800A. Zielinski. Matrix formulation for Dolph-Chebyshev beamforming
1800 -- 1802Moeness G. Amin. Time-varying spectrum estimation for a general class of nonstationary processes
1802 -- 1803Yuval Bistritz. Comment on "On zero location with respect to the unit circle of discrete-time linear system polynomials"
1803 -- 0Timothy J. Drummond. Correction to "Modulation-doped GaAs/(Al, Ga)As heterojunction field-effect transistors: MODFETs"
1804 -- 0Peter B. Aronhime. RC active filter design handbook