Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 31, Issue 10

1465 -- 1484Massoud Pedram. Energy-Efficient Datacenters
1485 -- 1498Ashish Kumar Singh, Kareem Ragab, Mario Lok, Constantine Caramanis, Michael Orshansky. Predictable Equation-Based Analog Optimization Based on Explicit Capture of Modeling Error Statistics
1499 -- 1507Salvatore Levantino, Paolo Maffezzoni. Computing the Perturbation Projection Vector of Oscillators via Frequency Domain Analysis
1508 -- 1521Rohit Sinha, Hiren D. Patel. synASM: A High-Level Synthesis Framework With Support for Parallel and Timed Constructs
1522 -- 1535Shivam Priyadarshi, Christopher S. Saunders, Nikhil Kriplani, Harun Demircioglu, W. Rhett Davis, Paul D. Franzon, Michael B. Steer. Parallel Transient Simulation of Multiphysics Circuits Using Delay-Based Partitioning
1536 -- 1545Dongchul Kim, Hyewon Kim, Yungseon Eo. Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Single Interconnect Lines
1546 -- 1557Kai-Ti Hsu, Subarna Sinha, Yu-Chuan Pi, Tsung-Yi Ho. A Hierarchy-Based Distributed Algorithm for Layout Geometry Operations
1558 -- 1571Muhammet Mustafa Ozdal, Steven M. Burns, Jiang Hu. Algorithms for Gate Sizing and Device Parameter Selection for High-Performance Designs
1572 -- 1585Jens Gladigau, Christian Haubelt, Jürgen Teich. Model-Based Virtual Prototype Acceleration
1586 -- 1599Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu. Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory
1600 -- 1613Yu-Jen Huang, Jin-Fu Li. Built-In Self-Repair Scheme for the TSVs in 3-D ICs
1614 -- 1625Xiaochun Yu, Ronald D. Blanton. Improving Diagnosis Through Failing Behavior Identification