Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 31, Issue 3

329 -- 342Alireza Ejlali, Bashir M. Al-Hashimi, Petru Eles. Low-Energy Standby-Sparing for Hard Real-Time Systems
343 -- 355Omid Sarbishei, Katarzyna Radecka, Zeljko Zilic. Analytical Optimization of Bit-Widths in Fixed-Point LTI Systems
356 -- 369Mingzhi Gao, Zuochang Ye, Yan Wang, Zhiping Yu. Efficient Full-Chip Statistical Leakage Analysis Based on Fast Matrix Vector Product
370 -- 379Chun-Jen Wei, Howard Chen, Sao-Jie Chen. Design and Implementation of Block-Based Partitioning for Parallel Flip-Chip Power-Grid Analysis
380 -- 390Jongwon Lee, Duo Chen, Venkataramanan Balakrishnan, Cheng-Kok Koh, Dan Jiao. A Quadratic Eigenvalue Solver of Linear Complexity for 3-D Electromagnetics-Based Analysis of Large-Scale Integrated Circuits
391 -- 403Jun Seomun, Insup Shin, Youngsoo Shin. Synthesis of Active-Mode Power-Gating Circuits
404 -- 417Andrew B. Kahng, Seokhyeong Kang, Rakesh Kumar, John Sartori. Recovery-Driven Design: Exploiting Error Resilience in Design of Energy-Efficient Processors
418 -- 431Elena Kakoulli, Vassos Soteriou, Theocharis Theocharides. Intelligent Hotspot Prediction for Network-on-Chip-Based Multicore Systems
432 -- 436Paolo Maffezzoni. Stochastic Analysis of Switched-Capacitor Circuits for Sampled Data Converters
437 -- 441Zhuo Li, Ying Zhou, Weiping Shi. $O(mn)$ Time Algorithm for Optimal Buffer Insertion of Nets With $m$ Sinks
442 -- 446Joon-Sung Yang, Nur A. Touba. Efficient Trace Signal Selection for Silicon Debug by Error Transmission Analysis
447 -- 451Sourasis Das, Ansuman Banerjee, Pallab Dasgupta. Early Analysis of Critical Faults: An Approach to Test Generation From Formal Specifications
452 -- 0Yuanzhe Wang, Xiang Hu, Chung-Kuan Cheng, Grantham K. H. Pang, Ngai Wong. Corrigendum to "A Realistic Early-Stage Power Grid Verification Algorithm Based on Hierarchical Constraints"