Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 31, Issue 8

1145 -- 1158Michael Eick, Helmut E. Graeb. MARS: Matching-Driven Analog Sizing
1159 -- 1168Xiaoke Qin, Weixun Wang, Prabhat Mishra. TCEC: Temperature and Energy-Constrained Scheduling in Real-Time Multitasking Systems
1169 -- 1179Byeong Yong Kong, In-Cheol Park. FIR Filter Synthesis Based on Interleaved Processing of Coefficient Generation and Multiplier-Block Synthesis
1180 -- 1193Shih-Hung Weng, Quan Chen, Chung-Kuan Cheng. Time-Domain Analysis of Large-Scale Circuits by Matrix Exponential Method With Adaptive Control
1194 -- 1207Moongon Jung, Joydeep Mitra, David Z. Pan, Sung Kyu Lim. TSV Stress-Aware Full-Chip Mechanical Reliability Analysis and Optimization for 3-D IC
1208 -- 1221Jianli Chen, Wenxing Zhu. An Analytical Placer for VLSI Standard Cell Placement
1222 -- 1234Xin Zhao, Jeremy R. Tolbert, Saibal Mukhopadhyay, Sung Kyu Lim. Variation-Aware Clock Network Design Methodology for Ultralow Voltage (ULV) Circuits
1235 -- 1248Arseniy Vitkovskiy, Vassos Soteriou, Chrysostomos Nicopoulos. A Dynamically Adjusting Gracefully Degrading Link-Level Fault-Tolerant Mechanism for NoCs
1249 -- 1262Hoang M. Le, Daniel Große, Rolf Drechsler. Automatic TLM Fault Localization for SystemC
1263 -- 1274Xiao Liu, Qiang Xu. On Signal Selection for Visibility Enhancement in Trace-Based Post-Silicon Validation
1275 -- 1287Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham. Testability-Driven Statistical Path Selection
1288 -- 1292ShengYu Shen, Ying Qin, Kefei Wang, Zhengbin Pang, Jianmin Zhang, Sikun Li. Inferring Assertion for Complementary Synthesis
1293 -- 1297Eric A. Foreman, Peter A. Habitz, Ming-C. Cheng, Chandu Visweswariah. A Novel Method for Reducing Metal Variation With Statistical Static Timing Analysis
1297 -- 1302Allon Adir, Amir Nahir, Avi Ziv. Concurrent Generation of Concurrent Programs for Post-Silicon Validation