| 201 | -- | 213 | Yingjie Lao, Bo Yuan, Chris H. Kim, Keshab K. Parhi. Reliable PUF-Based Local Authentication With Self-Correction |
| 214 | -- | 226 | Florian Sagstetter, Martin Lukasiewycz, Samarjit Chakraborty. Generalized Asynchronous Time-Triggered Scheduling for FlexRay |
| 227 | -- | 240 | Zidong Du, Shaoli Liu, Robert Fasthuber, Tianshi Chen, Paolo Ienne, Ling Li, Tao Luo, Qi Guo, Xiaobing Feng, Yunji Chen, Olivier Temam. An Accelerator for High Efficient Vision Processing |
| 241 | -- | 254 | Rui Wang, Dan Jia, Tao Li, Depei Qian. Achieving Versatile and Simultaneous Cache Optimizations With Nonvolatile SRAM |
| 255 | -- | 264 | Xiaodao Chen, Dongmei Zhang, Lizhe Wang, Ning Jia, Zhijiang Kang, Yun Zhang, Shiyan Hu. Design Automation for Interwell Connectivity Estimation in Petroleum Cyber-Physical Systems |
| 265 | -- | 278 | Arash Saifhashemi, Hsin-Ho Huang, Peter A. Beerel. Reconditioning: A Framework for Automatic Power Optimization of QDI Circuits |
| 279 | -- | 284 | Qiao Chen, Xiaoping Wang, Haibo Wan, Ran Yang. A Logic Circuit Design for Perfecting Memristor-Based Material Implication |
| 285 | -- | 298 | Changlin Chen, Yaowen Fu, Sorin Cotofana. Towards Maximum Utilization of Remained Bandwidth in Defected NoC Links |
| 299 | -- | 312 | Zhuoran Zhao, Andreas Gerstlauer, Lizy K. John. Source-Level Performance, Energy, Reliability, Power and Thermal (PERPT) Simulation |
| 313 | -- | 324 | Xin Lou, Ya Jun Yu, Pramod Kumar Meher. Lower Bound Analysis and Perturbation of Critical Path for Area-Time Efficient Multiple Constant Multiplications |
| 325 | -- | 335 | Ahish Mysore Somashekar, Spyros Tragoudas. Diagnosis of Performance Limiting Segments in Integrated Circuits Using Path Delay Measurements |
| 336 | -- | 345 | Jaeseok Park, Hyunyul Lim, Sungho Kang. FRESH: A New Test Result Extraction Scheme for Fast TSV Tests |
| 346 | -- | 350 | Liheng Zhu, Yasmine Badr, Shaodi Wang, Subramanian Iyer, Puneet Gupta. Assessing Benefits of a Buried Interconnect Layer in Digital Designs |
| 351 | -- | 355 | Irith Pomeranz. Sequential Test Generation Based on Preferred Primary Input Cubes |