Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 4, Issue 3

166 -- 177Wojciech Maly. Modeling of Lithography Related Yield Losses for CAD of VLSI Circuits
177 -- 189A. F. Franz, G. A. Franz. BAMBI -- A Design Model for Power MOSFET s
189 -- 197Wayne Wei-Ming Dai, Tetsuo Asano, Ernest S. Kuh. Routing Region Definition and Ordering Scheme for Building-Block Layout
198 -- 203Maciej J. Ciesielski. Two-Dimensional Routing for the Silc Silicon Compiler
204 -- 207Hideaki Kobayashi, Charles E. Drozd. Efficient Algorithms for Routing Interchangeable Terminals
208 -- 219James Reed, Alberto L. Sangiovanni-Vincentelli, Mauro Santomauro. A New Symbolic Channel Router: YACR2
220 -- 231Omar Wing, Shuo Huang, Rui Wang. Gate Matrix Layout
232 -- 239Fujio Yamamoto, Sakae Takahashi. Vectorized LU Decomposition Algorithms for Large-Scale Circuit Simulation
239 -- 250William J. Dally, Randal E. Bryant. A Hardware Architecture for Switch-Level Simulation
250 -- 263Tonysheng Lin, Stephen Y. H. Su. The S-Algorithm: A Promising Solution for Systematic Functional Test Generation
264 -- 269Niraj K. Jha, Jacob A. Abraham. Design of Testable CMOS Logic Circuits Under Arbitrary Delays
269 -- 285Giovanni De Micheli, Robert K. Brayton, Alberto L. Sangiovanni-Vincentelli. Optimal State Assignment for Finite State Machines
285 -- 296Jan M. Rabaey, Stephen P. Pope, Robert W. Brodersen. An Integrated Automated Layout Generation System for DSP Circuits
296 -- 303Edgar Sánchez-Sinencio, Jaime Ramírez-Angulo. AROMA: An Area Optimized CAD Program for Cascade SC Filter Design
303 -- 311Hugo De Man, Ivo Bolsens, E. Vanden Meersch, Johan Van Cleynenbreugel. DIALOG: An Expert Debugging System for MOSVLSI Design
312 -- 321Prithviraj Banerjee, Jacob A. Abraham. A Multivalued Algebra For Modeling Physical Failures in MOS VLSI Circuits
322 -- 328Min-Wen Chiang, J. C. Junior, Chuck Kao. A Simulation Method to Completely Model the Various Transistor I-V Operational Modes of Long Channel Depletion MOSFET s
329 -- 336Masayuki Terai. A Method of Improving the Terminal Assignment in the Channel Routing for Gate Arrays
336 -- 349John K. Ousterhout. A Switch-Level Timing Verifier for Digital MOS VLSI
349 -- 356. A Physical and SPICE-Compatible Model for the MOS Depletion Device