Journal: IEEE Trans. VLSI Syst.

Volume 17, Issue 12

1665 -- 1678Woosik Jeong, Ilkwon Kang, Kyowon Jin, Sungho Kang. A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree
1679 -- 1690Keith A. Bowman, Alaa R. Alameldeen, Srikanth T. Srinivasan, Chris Wilkerson. Impact of Die-to-Die and Within-Die Parameter Variations on the Clock Frequency and Throughput of Multi-Core Processors
1691 -- 1697Byeong Kil Lee, Lizy K. John. Hardware Acceleration for Media/Transaction Applications in Network Processors
1698 -- 1708Shu-Yu Jiang, Kuo-Hsing Cheng, Pei-Yi Jian. A 2.5-GHz Built-in Jitter Measurement System in a Serial-Link Transceiver
1709 -- 1718Chun Hok Ho, Chi Wai Yu, Philip Leong, Wayne Luk, Steven J. E. Wilton. Floating-Point FPGA: Architecture and Modeling
1719 -- 1729Andrea Ricci, Matteo Grisanti, Ilaria De Munari, Paolo Ciampolini. Improved Pervasive Sensing With RFID: An Ultra-Low Power Baseband Processor for UHF Tags
1730 -- 1741Sudarshan Bahukudumbi, Krishnendu Chakrabarty. Power Management Using Test-Pattern Ordering for Wafer-Level Test During Burn-In
1742 -- 1748Qingjin Du, Jingcheng Zhuang, Tad A. Kwasniewski. A Low-Power, Fast Acquisition, Data Recovery Circuit With Digital Threshold Decision for SFI-5 Application
1749 -- 1752Yiran Chen, Hai Li, Kaushik Roy, Cheng-Kok Koh. Gated Decap: Gate Leakage Control of On-Chip Decoupling Capacitors in Scaled Technologies