Journal: IEEE Trans. VLSI Syst.

Volume 29, Issue 8

1505 -- 1517Ahmet Turan Erozan, Simon Bosse, Mehdi B. Tahoori. Defect Detection in Transparent Printed Electronics Using Learning-Based Optical Inspection
1518 -- 1528Karthikeyan Nagarajan, Farid Uddin Ahmed, Mohammad Nasim Imtiaz Khan, Asmit De, Masud H. Chowdhury, Swaroop Ghosh. SecNVM: Power Side-Channel Elimination Using On-Chip Capacitors for Highly Secure Emerging NVM
1529 -- 1542Abdulrahman Alaql, Md Moshiur Rahman 0001, Swarup Bhunia. SCOPE: Synthesis-Based Constant Propagation Attack on Logic Locking
1543 -- 1552Prashansa Mukim, Forrest Brewer. Multiwire Phase Encoding: A Signaling Strategy for High-Bandwidth, Low-Power Data Movement
1553 -- 1566Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee 0001, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak. X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan
1567 -- 1574Junyoung Song, Sewook Hwang, Chulwoo Kim. A 32-Gb/s Dual-Mode Transceiver With One-Tap FIR and Two-Tap IIR RX Only Equalization in 65-nm CMOS Technology
1575 -- 1585Chuanshi Yang, Erik Olieman, Alphons Litjes, Lei Qiu 0002, Kai Tang, Yuanjin Zheng, Robert H. M. van Veldhoven. An Area-Efficient SAR ADC With Mismatch Error Shaping Technique Achieving 102-dB SFDR 90.2-dB SNDR Over 20-kHz Bandwidth
1586 -- 1590Chi-Ray Huang, Lih-Yih Chiou. An Energy-Efficient Conditional Biasing Write Assist With Built-In Time-Based Write-Margin-Tracking for Low-Voltage SRAM
1591 -- 1595Zhifei Lu, He Tang, Zhaofeng Ren, Ruogu Hua, Haoyu Zhuang, Xizhu Peng. A Timing Mismatch Background Calibration Algorithm With Improved Accuracy
1596 -- 1600Sarah Azimi, Corrado De Sio, Luca Sterpone. A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication