Journal: IEEE Trans. VLSI Syst.

Volume 31, Issue 4

411 -- 420Stephan Eggersglüß, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer. A New Static Compaction of Deterministic Test Sets
421 -- 430Irith Pomeranz. Sharing of Compressed Tests Among Logic Blocks
431 -- 441Abdullah Ibn Abbas, Xiangdong Jia, Glenn E. R. Cowan. A Power-Proportional, Dual-Bandwidth, and Constant-Delay Receiver Front-End for Energy-Efficient Dual-Rate Optical Links
442 -- 455Wu Zhou, Yiming Ouyang, Dongyu Xu, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen. Energy-Efficient Multiple Network-on-Chip Architecture With Bandwidth Expansion
456 -- 469Jie Chen 0042, Igor Loi, Eric Flamand, Giuseppe Tagliavini, Luca Benini, Davide Rossi. Scalable Hierarchical Instruction Cache for Ultralow-Power Processors Clusters
470 -- 483Wenhao Sun, Deng Liu, Zhiwei Zou, Wendi Sun, Song Chen 0001, Yi Kang. Sense: Model-Hardware Codesign for Accelerating Sparse CNNs on Systolic Arrays
484 -- 497Ming Ling, Qingde Lin, Ruiqi Chen, Haimeng Qi, Mengru Lin, Yanxiang Zhu, Jiansheng Wu. Vina-FPGA: A Hardware-Accelerated Molecular Docking Tool With Fixed-Point Quantization and Low-Level Parallelism
498 -- 511Jones William Goebel, Luciano Volcan Agostini, Bruno Zatt, Marcelo Schiavon Porto. A High-Throughput Hardware Design for the AV1 Decoder Intraprediction
512 -- 521Haofan Ding, Haiyan Dai, Xin Hong, Deyan Chen, Junyuan Wu, Jinghu Li, Zhicong Luo. A 10-Gb/s Inductorless Low-Power TIA With a 400-fF Low-Speed Avalanche Photodiode Realized in CMOS Process
522 -- 531Zhiting Lin, Min Chen, Peng Sun, Xiulong Wu, Qiang Zhao, Wenjuan Lu, Chunyu Peng. High Restore Yield NVSRAM Structures With Dual Complementary RRAM Devices for High-Speed Applications
532 -- 542Aika Kamei, Hideharu Amano, Takuya Kojima, Daiki Yokoyama, Kimiyoshi Usami, Keizo Hiraga, Kenta Suzuki, Kazuhiro Bessho. A Variation-Aware MTJ Store Energy Estimation Model for Edge Devices With Verify-and-Retryable Nonvolatile Flip-Flops
543 -- 554Shivani Bathla, Vinita Vasudevan. A Framework for Reliability Analysis of Combinational Circuits Using Approximate Bayesian Inference
555 -- 566Ayesha Siddique, Khaza Anuarul Hoque. Exposing Reliability Degradation and Mitigation in Approximate DNNs Under Permanent Faults
567 -- 577Yang Ge, Tejinder Singh Sandhu, Dmitri V. Truhachev, Kamal El-Sankary. A Single-TSV and Single-DCDL Approach for Skew Compensation of Multi-Dies Clock Synchronization in 3-D-ICs
578 -- 590Youngkwang Lee, Donghyun Han, Sungho Kang. TSV Built-In Self-Repair Architecture for Improving the Yield and Reliability of HBM
591 -- 595Sangwoo Han, Minjung Cho, Gi Lee, Eui-Young Chung. Page Type-Aware Data Migration Technique for Read Disturb Management of NAND Flash Memory
596 -- 600Pengzhou He, Yazheng Tu, Tianyou Bao, Leonel Sousa, Jiafeng Xie. COPMA: Compact and Optimized Polynomial Multiplier Accelerator for High-Performance Implementation of LWR-Based PQC
601 -- 605Irith Pomeranz. Test Data Compression for Transparent-Scan Sequences
606 -- 610Kexu Chen, Di Li 0003, Dongdong Chen, ChangChun Chai. An Improved MOS Self-Biased Ring Amplifier and Modified Auto-Zeroing Scheme