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Ibrahim Ahmed 0001, Shuze Zhao, James Meijers, Olivier Trescases, Vaughn Betz. FRoC 2.0: Automatic BRAM and Logic Testing to Enable Dynamic Voltage Scaling for FPGA Applications. TRETS, 12(4), 2019. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAsIbrahim Ahmed, Shuze Zhao, James Meijers, Olivier Trescases, Vaughn Betz. fpl 2018: 68-75 [doi] Automatic Application-Specific Calibration to Enable Dynamic Voltage Scaling in FPGAsIbrahim Ahmed, Shuze Zhao, Olivier Trescases, Vaughn Betz. tcad, 37(12):3095-3108, 2018. [doi]
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