Syed M. Alam, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel. Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations. Microelectronics Journal, 38(4-5):463-473, 2007. [doi]
@article{AlamGTT07,
title = {Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations},
author = {Syed M. Alam and Chee Lip Gan and Carl V. Thompson and Donald E. Troxel},
year = {2007},
doi = {10.1016/j.mejo.2006.11.017},
url = {http://dx.doi.org/10.1016/j.mejo.2006.11.017},
tags = {analysis, reliability, design},
researchr = {https://researchr.org/publication/AlamGTT07},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {38},
number = {4-5},
pages = {463-473},
}