Active ESD protection for input transistors in a 40-nm CMOS process

Federico A. Altolaguirre, Ming-Dou Ker. Active ESD protection for input transistors in a 40-nm CMOS process. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

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