The following publications are possibly variants of this publication:
- Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuitsShih-Hung Chen, Ming-Dou Ker. mr, 47(9-11):1502-1505, 2007. [doi]
- MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS ProcessMing-Dou Ker, Kun-Hsien Lin, Che-Hao Chuang. ieicet, 88-C(3):429-436, 2005. [doi]
- ESD protection design for wideband RF applications in 65-nm CMOS processLi-Wei Chu, Chun-Yu Lin, Ming-Dou Ker, Ming-Hsiang Song, Jeng-Chou Tseng, Chewnpu Jou, Ming-Hsien Tsai. iscas 2014: 1480-1483 [doi]
- On-chip ESD protection design by using polysilicon diodes in CMOS processMing-Dou Ker, Tung-Yang Chen, Tai-Ho Wang, Chung-Yu Wu. jssc, 36(4):676-686, 2001. [doi]