Gate Leakage Impact on Full Open Defects in Interconnect Lines

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. VLSI Syst., 19(12):2209-2220, 2011. [doi]

Abstract

Abstract is missing.