Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out - researchr publication

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Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. on CAD of Integrated Circuits and Systems, 30(12):1911-1922, 2011. [doi]

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