The following publications are possibly variants of this publication:
- Diagnosis of full open defects in interconnect lines with fan-outRosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. ets 2010: 233-238 [doi]
- Diagnosis of Full Open Defects in Interconnecting LinesRosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi. vts 2007: 158-166 [doi]
- Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage CurrentsDaniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman. tcad, 32(2):301-312, 2013. [doi]