Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies - researchr publication authors

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Mustafa Badaroglu, Stéphane Donnay, Hugo J. De Man, Yann A. Zinzius, Georges G. E. Gielen, Willy Sansen, Tony Fonden, Svante Signell. Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies. J. Solid-State Circuits, 38(7):1250-1260, 2003. [doi]

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