Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies - researchr publication related

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Mustafa Badaroglu, Stéphane Donnay, Hugo J. De Man, Yann A. Zinzius, Georges G. E. Gielen, Willy Sansen, Tony Fonden, Svante Signell. Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies. J. Solid-State Circuits, 38(7):1250-1260, 2003. [doi]

The following publications are possibly variants of this publication:

Substrate noise generation in complex digital systems: efficient modeling and simulation methodology and experimental verificationMarc van Heijningen, Mustafa Badaroglu, Stéphane Donnay, Georges G. E. Gielen, Hugo J. De Man. jssc, 37(8):1065-1072, 2002. [doi]

Analysis and experimental verification of digital substrate noise generation for epi-type substratesMarc van Heijningen, John Compiet, Piet Wambacq, Stéphane Donnay, Marc Engels, Ivo Bolsens. jssc, 35(7):1002-1008, 2000. [doi]

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