Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

Mustafa Badaroglu, Stéphane Donnay, Hugo J. De Man, Yann A. Zinzius, Georges G. E. Gielen, Willy Sansen, Tony Fonden, Svante Signell. Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies. J. Solid-State Circuits, 38(7):1250-1260, 2003. [doi]

@article{BadarogluDMZGSF03,
  title = {Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies},
  author = {Mustafa Badaroglu and Stéphane Donnay and Hugo J. De Man and Yann A. Zinzius and Georges G. E. Gielen and Willy Sansen and Tony Fonden and Svante Signell},
  year = {2003},
  doi = {10.1109/JSSC.2003.813254},
  url = {https://doi.org/10.1109/JSSC.2003.813254},
  researchr = {https://researchr.org/publication/BadarogluDMZGSF03},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {38},
  number = {7},
  pages = {1250-1260},
}