Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies

Mustafa Badaroglu, Stéphane Donnay, Hugo J. De Man, Yann A. Zinzius, Georges G. E. Gielen, Willy Sansen, Tony Fonden, Svante Signell. Modeling and experimental verification of substrate noise generation in a 220-Kgates WLAN system-on-chip with multiple supplies. J. Solid-State Circuits, 38(7):1250-1260, 2003. [doi]

Abstract

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