Extending OPMISR beyond 10x Scan Test Efficiency - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera. Extending OPMISR beyond 10x Scan Test Efficiency. IEEE Design & Test of Computers, 19(5):65-72, 2002. [doi]

This author has not been identified. Look up 'Carl Barnhart' in GoogleThis author has not been identified. Look up 'Vanessa Brunkhorst' in GoogleThis author has not been identified. Look up 'Frank Distler' in GoogleThis author has not been identified. Look up 'Owen Farnsworth' in GoogleThis author has not been identified. Look up 'Andrew Ferko' in GoogleThis author has not been identified. Look up 'Brion L. Keller' in GoogleThis author has not been identified. Look up 'David Scott' in GoogleThis author has not been identified. Look up 'Bernd Könemann' in GoogleThis author has not been identified. Look up 'Takeshi Onodera' in Google

runs on WebDSL