Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera. Extending OPMISR beyond 10x Scan Test Efficiency. IEEE Design & Test of Computers, 19(5):65-72, 2002. [doi]
@article{BarnhartBDFFKSKO02,
title = {Extending OPMISR beyond 10x Scan Test Efficiency},
author = {Carl Barnhart and Vanessa Brunkhorst and Frank Distler and Owen Farnsworth and Andrew Ferko and Brion L. Keller and David Scott and Bernd Könemann and Takeshi Onodera},
year = {2002},
doi = {10.1109/MDT.2002.1033794},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.1033794},
tags = {testing},
researchr = {https://researchr.org/publication/BarnhartBDFFKSKO02},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {19},
number = {5},
pages = {65-72},
}