Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae-Hyun Kim, Sung Kyu Lim. Backend Dielectric Reliability Full Chip Simulator. IEEE Trans. VLSI Syst., 22(8):1750-1762, 2014. [doi]
@article{BashirCMKL14,
title = {Backend Dielectric Reliability Full Chip Simulator},
author = {Muhammad Muqarrab Bashir and Chang-Chih Chen and Linda Milor and Dae-Hyun Kim and Sung Kyu Lim},
year = {2014},
doi = {10.1109/TVLSI.2013.2277856},
url = {http://dx.doi.org/10.1109/TVLSI.2013.2277856},
researchr = {https://researchr.org/publication/BashirCMKL14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {22},
number = {8},
pages = {1750-1762},
}