Backend Dielectric Reliability Full Chip Simulator

Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae-Hyun Kim, Sung Kyu Lim. Backend Dielectric Reliability Full Chip Simulator. IEEE Trans. VLSI Syst., 22(8):1750-1762, 2014. [doi]

Abstract

Abstract is missing.