Pseudo Random Patterns Using Markov Sources for Scan BIST - researchr publication authors

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Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz. Pseudo Random Patterns Using Markov Sources for Scan BIST. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1013-1021, IEEE Computer Society, 2002. [doi]

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