Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz. Pseudo Random Patterns Using Markov Sources for Scan BIST. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1013-1021, IEEE Computer Society, 2002. [doi]
@inproceedings{BasturkmenRP02,
title = {Pseudo Random Patterns Using Markov Sources for Scan BIST},
author = {Nadir Z. Basturkmen and Sudhakar M. Reddy and Irith Pomeranz},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75431013abs.htm},
tags = {source-to-source, Markov, open-source},
researchr = {https://researchr.org/publication/BasturkmenRP02},
cites = {0},
citedby = {0},
pages = {1013-1021},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}