Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology - researchr publication related

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Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology. In 3rd Latin American Test Workshop, LATW 2002, Montevideo, Uruguay, February 10-13, 2002. pages 99-104, IEEE, 2002.

The following publications are possibly variants of this publication:

On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical SystemsVincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. date 2002: 1120 [doi]

Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical SystemsVincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet. vts 2002: 439-444 [doi]

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