Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction - researchr publication authors

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Shraddha Bodhe, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman. Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. IEEE Trans. VLSI Syst., 25(4):1497-1505, 2017. [doi]

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