Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction

Shraddha Bodhe, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman. Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. IEEE Trans. VLSI Syst., 25(4):1497-1505, 2017. [doi]

Abstract

Abstract is missing.