Shraddha Bodhe, Irith Pomeranz, M. Enamul Amyeen, Srikanth Venkataraman. Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction. IEEE Trans. VLSI Syst., 25(4):1497-1505, 2017. [doi]
@article{BodhePAV17,
title = {Reordering Tests for Efficient Fail Data Collection and Tester Time Reduction},
author = {Shraddha Bodhe and Irith Pomeranz and M. Enamul Amyeen and Srikanth Venkataraman},
year = {2017},
doi = {10.1109/TVLSI.2016.2628321},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2016.2628321},
researchr = {https://researchr.org/publication/BodhePAV17},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {25},
number = {4},
pages = {1497-1505},
}