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ALADIN: a multilevel testability analyzer for VLSI system design

Massimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Fabrizio Ferrandi, Donatella Sciuto, Giuseppe Zaza. ALADIN: a multilevel testability analyzer for VLSI system design. IEEE Trans. VLSI Syst., 2(2):157-171, 1994. [doi]

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Massimo Bombana

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Giacomo Buonanno

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Patrizia Cavalloro

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Fabrizio Ferrandi

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Donatella Sciuto

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Giuseppe Zaza

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