ALADIN: a multilevel testability analyzer for VLSI system design

Massimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Fabrizio Ferrandi, Donatella Sciuto, Giuseppe Zaza. ALADIN: a multilevel testability analyzer for VLSI system design. IEEE Trans. VLSI Syst., 2(2):157-171, 1994. [doi]

Abstract

Abstract is missing.