ALADIN: a multilevel testability analyzer for VLSI system design

Massimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Fabrizio Ferrandi, Donatella Sciuto, Giuseppe Zaza. ALADIN: a multilevel testability analyzer for VLSI system design. IEEE Trans. VLSI Syst., 2(2):157-171, 1994. [doi]

@article{BombanaBCFSZ94,
  title = {ALADIN: a multilevel testability analyzer for VLSI system design},
  author = {Massimo Bombana and Giacomo Buonanno and Patrizia Cavalloro and Fabrizio Ferrandi and Donatella Sciuto and Giuseppe Zaza},
  year = {1994},
  doi = {10.1109/92.285743},
  url = {http://doi.ieeecomputersociety.org/10.1109/92.285743},
  tags = {testing, design},
  researchr = {https://researchr.org/publication/BombanaBCFSZ94},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {2},
  number = {2},
  pages = {157-171},
}