A Gated Clock Scheme for Low Power Scan-Based BIST - researchr publication

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Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch. A Gated Clock Scheme for Low Power Scan-Based BIST. In 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy. pages 87-89, IEEE Computer Society, 2001. [doi]

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