Power-Aware Test Pattern Generation for At-Speed LOS Testing - researchr publication authors

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Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen. Power-Aware Test Pattern Generation for At-Speed LOS Testing. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 506-510, IEEE Computer Society, 2011. [doi]

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