Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen. Power-Aware Test Pattern Generation for At-Speed LOS Testing. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 506-510, IEEE Computer Society, 2011. [doi]
@inproceedings{BosioDGTVMW11,
title = {Power-Aware Test Pattern Generation for At-Speed LOS Testing},
author = {Alberto Bosio and Luigi Dilillo and Patrick Girard and Aida Todri and Arnaud Virazel and Kohei Miyase and X. Wen},
year = {2011},
doi = {10.1109/ATS.2011.50},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.50},
researchr = {https://researchr.org/publication/BosioDGTVMW11},
cites = {0},
citedby = {0},
pages = {506-510},
booktitle = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-1984-4},
}