Power-Aware Test Pattern Generation for At-Speed LOS Testing - researchr publication related

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Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen. Power-Aware Test Pattern Generation for At-Speed LOS Testing. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 506-510, IEEE Computer Society, 2011. [doi]

The following publications are possibly variants of this publication:

Power-aware test generation with guaranteed launch safety for at-speed scan testingXiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor. vts 2011: 166-171 [doi]

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