Failures in ultrathin oxides: Stored energy or carrier energy driven?

S. Bruyère, F. Monsieur, D. Roy, E. Vincent, G. Ghibaudo. Failures in ultrathin oxides: Stored energy or carrier energy driven?. Microelectronics Reliability, 41(9-10):1367-1372, 2001.

Authors

S. Bruyère

This author has not been identified. Look up 'S. Bruyère' in Google

F. Monsieur

This author has not been identified. Look up 'F. Monsieur' in Google

D. Roy

This author has not been identified. Look up 'D. Roy' in Google

E. Vincent

This author has not been identified. Look up 'E. Vincent' in Google

G. Ghibaudo

This author has not been identified. Look up 'G. Ghibaudo' in Google