Delay Fault Models and Test Generation for Random Logic Sequential Circuits

Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell. Delay Fault Models and Test Generation for Random Logic Sequential Circuits. In DAC. pages 165-172, 1992. [doi]

Authors

Tapan J. Chakraborty

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Vishwani D. Agrawal

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Michael L. Bushnell

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