Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell. Delay Fault Models and Test Generation for Random Logic Sequential Circuits. In DAC. pages 165-172, 1992. [doi]
@inproceedings{ChakrabortyAB92,
title = {Delay Fault Models and Test Generation for Random Logic Sequential Circuits},
author = {Tapan J. Chakraborty and Vishwani D. Agrawal and Michael L. Bushnell},
year = {1992},
url = {http://portal.acm.org/citation.cfm?id=113938.117295},
tags = {testing, random testing, logic},
researchr = {https://researchr.org/publication/ChakrabortyAB92},
cites = {0},
citedby = {0},
pages = {165-172},
booktitle = {DAC},
}