Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip - researchr publication authors

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Anshuman Chandra, Krishnendu Chakrabarty. Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 166-169, ACM, 2001. [doi]

This author has not been identified. Look up 'Anshuman Chandra' in GoogleThis author has not been identified. Look up 'Krishnendu Chakrabarty' in Google

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