Anshuman Chandra, Krishnendu Chakrabarty. Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 166-169, ACM, 2001. [doi]
@inproceedings{ChandraC01,
title = {Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip},
author = {Anshuman Chandra and Krishnendu Chakrabarty},
year = {2001},
url = {http://jamaica.ee.pitt.edu/Archives/ProceedingArchives/Dac/Dac2001/papers/2001/dac01/pdffiles/10_5.pdf},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/ChandraC01},
cites = {0},
citedby = {0},
pages = {166-169},
booktitle = {Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001},
publisher = {ACM},
isbn = {1-58113-297-2},
}