Anshuman Chandra, Krishnendu Chakrabarty. Combining Low-Power Scan Testing and Test Data Compression for System-on-a-Chip. In Proceedings of the 38th Design Automation Conference, DAC 2001, Las Vegas, NV, USA, June 18-22, 2001. pages 166-169, ACM, 2001. [doi]
Abstract is missing.