The following publications are possibly variants of this publication:
- Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISOGlenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren. ei-iss 2013: [doi]
- Hot Pixel Behavior as Pixel Size Reduces to 1 micronGlenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren. ei-iss 2017: 39-45 [doi]
- Image degradation from hot pixel defects with pixel size shrinkageGlenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren. ei-iss 2019: 1-7 [doi]
- Relating digital imager defect rates to pixel size, sensor area and ISOGlenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren. dft 2012: 164-169 [doi]
- Improved correction for hot pixels in digital imagersGlenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren. dft 2014: 116-121 [doi]
- Single Event Upsets and Hot Pixels in digital imagersGlenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren. dft 2015: 41-46 [doi]