A New Device for In Situ Measurement of an Impedance Profile at 1-20 MHz

Xavier Chavanne, Jean-Pierre Frangi, Gilles de Rosny. A New Device for In Situ Measurement of an Impedance Profile at 1-20 MHz. IEEE T. Instrumentation and Measurement, 59(7):1850-1859, 2010. [doi]

Abstract

Abstract is missing.