Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology

Hsin-Chieh Chen, Wei-Chung Chen, Ying-Wei Chou, Meng-Wei Chien, Chin-Long Wey, Ke-Horng Chen, Ying-Hsi Lin, Tsung-Yen Tsai, Chao-Cheng Lee. Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]

Abstract

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