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System-level modeling and microprocessor reliability analysis for backend wearout mechanisms

Chang-Chih Chen, Linda Milor. System-level modeling and microprocessor reliability analysis for backend wearout mechanisms. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1615-1620, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

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Chang-Chih Chen

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Linda Milor

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