Chang-Chih Chen, Linda Milor. System-level modeling and microprocessor reliability analysis for backend wearout mechanisms. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1615-1620, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]
@inproceedings{ChenM13-5,
title = {System-level modeling and microprocessor reliability analysis for backend wearout mechanisms},
author = {Chang-Chih Chen and Linda Milor},
year = {2013},
url = {http://dl.acm.org/citation.cfm?id=2485672},
researchr = {https://researchr.org/publication/ChenM13-5},
cites = {0},
citedby = {0},
pages = {1615-1620},
booktitle = {Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013},
editor = {Enrico Macii},
publisher = {EDA Consortium San Jose, CA, USA / ACM DL},
isbn = {978-1-4503-2153-2},
}