Jung Hwan Choi, Jayathi Murthy, Kaushik Roy. The effect of process variation on device temperature in FinFET circuits. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 747-751, IEEE, 2007. [doi]
No references recorded for this publication.
No citations of this publication recorded.