Flexible Packed Stencil Design With Multiple Shaping Apertures and Overlapping Shots for E-beam Lithography

Chris C. N. Chu, Wai-Kei Mak. Flexible Packed Stencil Design With Multiple Shaping Apertures and Overlapping Shots for E-beam Lithography. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(10):1652-1663, 2015. [doi]

@article{ChuM15,
  title = {Flexible Packed Stencil Design With Multiple Shaping Apertures and Overlapping Shots for E-beam Lithography},
  author = {Chris C. N. Chu and Wai-Kei Mak},
  year = {2015},
  doi = {10.1109/TCAD.2015.2427256},
  url = {http://dx.doi.org/10.1109/TCAD.2015.2427256},
  researchr = {https://researchr.org/publication/ChuM15},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {34},
  number = {10},
  pages = {1652-1663},
}